
Single Shot White Light Interference Microscopy for 3D Surface Profilometry Using Single Chip Color Camera
Author(s) -
Vishal Srivastava,
M. Inam,
Ranjeet Kumar,
Dalip Singh Mehta
Publication year - 2016
Publication title -
journal of the optical society of korea/journal of the optical society of korea
Language(s) - English
Resource type - Journals
eISSN - 2093-6885
pISSN - 1226-4776
DOI - 10.3807/josk.2016.20.6.784
Subject(s) - optics , interferometry , interference microscopy , white light interferometry , materials science , wavelength , profilometer , tilt (camera) , microscopy , interference (communication) , microscope , physics , surface finish , optoelectronics , computer science , mechanical engineering , computer network , channel (broadcasting) , composite material , engineering