Open AccessWeibull strength distribution and reliability S-N percentiles for tensile tests
Author(s) -
Manuel Baro,
Manuel R. PiñaMonarrez,
Jesús M. Barraza-Contreras
Publication year - 2022
Publication title -
revista de ciencias tecnológicas
Language(s) - English
Resource type - Journals
ISSN - 2594-1925
DOI - 10.37636/recit.v53284299
Subject(s) - weibull distribution , weibull modulus , reliability (semiconductor) , percentile , ultimate tensile strength , stress (linguistics) , structural engineering , weibull fading , materials science , reliability engineering , composite material , statistics , mathematics , engineering , power (physics) , physics , thermodynamics , linguistics , philosophy , decoding methods , rayleigh fading , fading
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