
Combined Gate Replacement and Transmission Gate Based Logic Insertion Algorithm for Leakage Optimization in VLSI Circuits
Author(s) -
V. Leela Rani,
M. Madhavi Latha
Publication year - 2015
Publication title -
international journal of applied engineering research/international journal of applied engineering research
Language(s) - English
Resource type - Journals
eISSN - 0973-9769
pISSN - 0973-4562
DOI - 10.37622/ijaer/10.21.2015.42610-42615
Subject(s) - transmission gate , very large scale integration , leakage (economics) , electronic engineering , electronic circuit , computer science , logic gate , materials science , algorithm , electrical engineering , engineering , transistor , voltage , economics , macroeconomics