Predicting Defect-Prone Software Module Using GA-SVM
Author(s) -
Youngok Kim,
Ki-Tae Kwon
Publication year - 2013
Publication title -
kips transactions on software and data engineering
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2734-0503
pISSN - 2287-5905
DOI - 10.3745/ktsde.2013.2.1.001
Subject(s) - support vector machine , pattern recognition (psychology) , computer science , artificial intelligence , backpropagation , genetic algorithm , classifier (uml) , kernel (algebra) , ranking svm , data mining , machine learning , artificial neural network , mathematics , combinatorics
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