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The Tunneling Effect at Semiconductor Interfaces by Hall Measurement
Author(s) -
Teresa Oh
Publication year - 2019
Publication title -
han'gug jaeryo haghoeji/han-guk jaeryo hakoeji
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 10
eISSN - 2287-7258
pISSN - 1225-0562
DOI - 10.3740/mrsk.2019.29.7.408
Subject(s) - materials science , semiconductor , quantum tunnelling , hall effect , condensed matter physics , optoelectronics , engineering physics , nanotechnology , electrical engineering , physics , electrical resistivity and conductivity , engineering

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