
Influence of Electron Beam Irradiation on the Electrical and Optical Properties of InGaZnO Thin Film Transistor
Author(s) -
조인환,
Hai-Woong Park,
Chan-Joon Kim,
ByungHyuk Jun
Publication year - 2017
Publication title -
han'gug jaeryo haghoeji/han-guk jaeryo hakoeji
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 10
eISSN - 2287-7258
pISSN - 1225-0562
DOI - 10.3740/mrsk.2017.27.6.345
Subject(s) - materials science , optoelectronics , irradiation , thin film transistor , cathode ray , electron beam processing , transistor , electron , nanotechnology , electrical engineering , voltage , physics , quantum mechanics , nuclear physics , engineering , layer (electronics)