Open AccessInfluence of Electron Beam Irradiation on the Electrical Properties of Zn-Sn-O Thin Film Transistor
Author(s) -
조인환,
조경일,
최준혁,
박해웅,
김찬중,
전병혁
Publication year - 2017
Publication title -
han'gug jaeryo haghoeji/han-guk jaeryo hakoeji
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 10
eISSN - 2287-7258
pISSN - 1225-0562
DOI - 10.3740/mrsk.2017.27.4.216
Subject(s) - materials science , x ray photoelectron spectroscopy , thin film transistor , irradiation , thin film , band gap , semiconductor , electron beam processing , analytical chemistry (journal) , optoelectronics , nanotechnology , nuclear magnetic resonance , chemistry , physics , layer (electronics) , chromatography , nuclear physics