Open AccessInfluence of Electron Beam Irradiation on the Electrical Properties of Zn-Sn-O Thin Film Transistor
Author(s) -
In-Hwan Cho,
Kyoung-Il Jo,
Jun Hyuk Choi,
Hai-Woong Park,
Chan-Joong Kim,
ByungHyuk Jun
Publication year - 2017
Publication title -
korean journal of materials research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 10
eISSN - 2287-7258
pISSN - 1225-0562
DOI - 10.3740/mrsk.2017.27.4.216
Subject(s) - materials science , x ray photoelectron spectroscopy , thin film transistor , irradiation , thin film , band gap , semiconductor , electron beam processing , analytical chemistry (journal) , optoelectronics , nanotechnology , nuclear magnetic resonance , chemistry , physics , layer (electronics) , chromatography , nuclear physics
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