Open AccessMetal-Semiconductor Contact Behavior of Solution-Processed ZnSnO Thin Film Transistors
Author(s) -
영민 정,
근규 송,
규희 우,
태환 전,
양호 정,
주호 문
Publication year - 2010
Publication title -
korean journal of materials research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 10
eISSN - 2287-7258
pISSN - 1225-0562
DOI - 10.3740/mrsk.2010.20.8.401
Subject(s) - materials science , kelvin probe force microscope , work function , electrode , thin film transistor , thin film , ohmic contact , semiconductor , annealing (glass) , spin coating , chemical engineering , metal , analytical chemistry (journal) , nanotechnology , optoelectronics , composite material , metallurgy , layer (electronics) , atomic force microscopy , chemistry , engineering , chromatography
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