Open AccessCrystallographic Characterization of the (Bi,La)4Ti3O12 Film by High-Resolution Electron Microscopy
Author(s) -
Doek-Won Lee,
Yang Jia,
Tae-Su Park,
Nam-Kyung Kim,
Seung Jin Yeom,
Ju-Chul Park,
Soun-Young Lee,
Sung Wook Park
Publication year - 2003
Publication title -
han'gug jaeryo haghoeji/han-guk jaeryo hakoeji
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 10
eISSN - 2287-7258
pISSN - 1225-0562
DOI - 10.3740/mrsk.2003.13.7.478
Subject(s) - materials science , crystallography , stacking , electron diffraction , atomic units , transmission electron microscopy , crystallization , atom (system on chip) , annealing (glass) , diffraction , resolution (logic) , optics , nanotechnology , nuclear magnetic resonance , chemistry , physics , metallurgy , organic chemistry , quantum mechanics , artificial intelligence , computer science , embedded system