
Junction Size Dependence of Magnetic and Magnetotransport Properties in MTJs
Author(s) -
V. K. Sankaranarayanan,
Yongkang Hu,
CheolGi Kim,
Chong-Oh Kim,
Hee-bok Lee
Publication year - 2003
Publication title -
han'gug jaeryo haghoeji/han-guk jaeryo hakoeji
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 10
eISSN - 2287-7258
pISSN - 1225-0562
DOI - 10.3740/mrsk.2003.13.6.369
Subject(s) - materials science , condensed matter physics , annealing (glass) , coercivity , magnetoresistance , surface roughness , sputter deposition , surface finish , tunnel magnetoresistance , sputtering , thin film , magnetic field , nanotechnology , layer (electronics) , composite material , physics , quantum mechanics