Open AccessOptical Properties of Al1-xInxN Thin film on GaN Grown by MOVPE
Author(s) -
동원 신,
성익 김,
Yoshihiro Oshida,
증수 허
Publication year - 2002
Publication title -
korean journal of materials research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 10
eISSN - 2287-7258
pISSN - 1225-0562
DOI - 10.3740/mrsk.2002.12.2.112
Subject(s) - materials science , metalorganic vapour phase epitaxy , reflection high energy electron diffraction , epitaxy , photoluminescence , diffraction , layer (electronics) , optoelectronics , electron diffraction , reflection (computer programming) , thin film , optics , nanotechnology , physics , computer science , programming language
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