Open AccessMultiatributte Double Sampling Control Chart
Author(s) -
Esmeralda Ramírez-Méndez,
Mario Cantú-Sifuentes
Publication year - 2014
Publication title -
industrial and systems engineering review
Language(s) - English
Resource type - Journals
ISSN - 2329-0188
DOI - 10.37266/iser.2014v2i1.pp42-51
Subject(s) - control chart , chart , sampling (signal processing) , computer science , shewhart individuals control chart , statistics , control (management) , x bar chart , data mining , control limits , mathematics , ewma chart , artificial intelligence , process (computing) , telecommunications , detector , operating system
In recent years, multiattribute control charts have received an increasing attention. These charts are able to monitor two or more attributes in the same chart. In addition, there are many applications of multiatributte control charts in a wide variety of manufacturing processes and services. In this article, a multiattribute double sampling (DS D2) control chart is proposed. Double sampling is a methodology used to improve the efficiency of a control chart to detect quality issues without increase the sampling. Results of comparative studies via simulation indicate that the proposed control chart significantly outperforms in most of the supposed sceneries, in terms of the Average Run Length.