Open AccessGrowth and Characterization of Al (111) Thin Film on Piezoelectric Wafers for SAW Device Fabrication for Space Applications
Author(s) -
Manish Sahu,
Ajaya Kumar PS,
Chiranjit Karmakar,
Gunjan Rastogi,
R.K. Kaneriya,
R. B. Upadhyay
Publication year - 2022
Publication title -
nanoarchitectonics
Language(s) - English
Resource type - Journals
eISSN - 2717-5332
pISSN - 2717-5324
DOI - 10.37256/nat.4120231624
Subject(s) - materials science , wafer , thin film , nichrome , sheet resistance , full width at half maximum , piezoelectricity , optoelectronics , quartz , scanning electron microscope , composite material , optics , nanotechnology , physics , layer (electronics)
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