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Energy Optimization of NoC Based on Voltage-frequency Islands under Processor Reliability Constraints
Author(s) -
Jian-xian Zhang,
Duan Zhou,
Yintang Yang,
Rui Lai,
Xiang Gao
Publication year - 2011
Publication title -
journal of electronics information technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.191
H-Index - 27
ISSN - 1009-5896
DOI - 10.3724/sp.j.1146.2010.01266
Subject(s) - reliability (semiconductor) , network on a chip , energy (signal processing) , computer science , embedded system , reliability engineering , engineering , power (physics) , mathematics , physics , statistics , quantum mechanics

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