z-logo
open-access-imgOpen Access
A Simplified Log-Likelihood Ratio Algorithm with Broken Line Analysis
Author(s) -
Tao Yan,
Le Ru,
Xing-min Du
Publication year - 2011
Publication title -
journal of electronics information technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.191
H-Index - 27
ISSN - 1009-5896
DOI - 10.3724/sp.j.1146.2006.02077
Subject(s) - algorithm , line (geometry) , maximum likelihood , computer science , mathematics , statistics , geometry

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom