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A Comparison of Three Confidence Intervals of Composite Reliability of A Unidimensional Test
Author(s) -
Baojuan YE,
Zhonglin Wen
Publication year - 2012
Publication title -
acta psychologica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.153
H-Index - 2
ISSN - 0439-755X
DOI - 10.3724/sp.j.1041.2011.00453
Subject(s) - statistics , confidence interval , reliability (semiconductor) , test (biology) , composite number , mathematics , reliability engineering , psychology , geology , physics , engineering , algorithm , paleontology , power (physics) , quantum mechanics

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