Open AccessObservation by Scanning Electron Microscope (SEM) and Analysis of Silicon Content on Glume of Rice Variant Strain with Bird Disaster Resistance
Author(s) -
Sheng-Dong JI,
Hai-Sha WANG,
De-Lai ZHU,
Lei-Lei HOU,
Song-Hao WEI,
Xiangyu Zhang,
Yu Zhang,
Chunyan Li,
MA Ya-feng,
Dandan Guo
Publication year - 2013
Publication title -
acta agronomica sinica
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.264
H-Index - 15
ISSN - 0496-3490
DOI - 10.3724/sp.j.1006.2012.00725
Subject(s) - glume , scanning electron microscope , strain (injury) , silicon , materials science , electron microscope , resistance (ecology) , biology , agronomy , composite material , metallurgy , physics , optics , anatomy
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