Open AccessAPPLICATION OF POOLE-FRENKEL EFFECT AND CHARGE CARRIER INJECTION FOR DEFECT TESTING OF THERMAL SILICON DIOXIDE
Author(s) -
А. A. Shiryaev,
В. М. Воротынцев,
E. L. Shobolov
Publication year - 2019
Publication title -
èlektronnaâ tehnika. seriâ 2. poluprovodnikovye pribory
Language(s) - English
Resource type - Journals
ISSN - 2073-8250
DOI - 10.36845/2073-8250-2019-254-3-29-37
Subject(s) - silicon dioxide , materials science , thermal , silicon , charge (physics) , charge carrier , engineering physics , optoelectronics , engineering , physics , thermodynamics , composite material , quantum mechanics