
COMPARISON OF ELECTRICAL AND IP-OPTICAL METHODS OF TEMPERATURE MEASUREMENT OF ALGAN/GAN HEMT
Author(s) -
N.L. Evdokimova,
V. V. Dolgov,
V. S. Ezhov,
A.Yu. Motorin,
И.М. Аболдуев,
Yu.A. Kontsevoy,
Scientific,
Production Enterprise,
Pulsar,
Production Enterprise Pulsar
Publication year - 2019
Publication title -
èlektronnaâ tehnika. seriâ 2. poluprovodnikovye pribory
Language(s) - English
Resource type - Journals
ISSN - 2073-8250
DOI - 10.36845/2073-8250-2019-253-2-41-52
Subject(s) - high electron mobility transistor , optoelectronics , materials science , electrical engineering , transistor , engineering , voltage