Uncertainty, sensitivity and scenario analysis: how do they fit together?
Author(s) -
Holger R. Maier,
Joseph H. A. Guillaume,
Cameron McPhail,
Seth Westra,
Jan Kwakkel,
Seyyed Mohammad Razavi,
Hedwig van Delden,
Mark Thyer,
S J Culley,
Anthony J. Jakeman
Publication year - 2021
Publication title -
modsim2021, 24th international congress on modelling and simulation.
Language(s) - English
Resource type - Conference proceedings
DOI - 10.36334/modsim.2021.j5.maier
Subject(s) - sensitivity (control systems) , computer science , engineering , electronic engineering
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