Open AccessData-driven Prognostics based on Evolving Fuzzy Degradation Models for Power Semiconductor Devices
Author(s) -
Khoury Boutrous,
Iury Bessa,
V. Puig,
Fatiha Nejjari,
Reinaldo M. Palhares
Publication year - 2022
Publication title -
proceedings of ... european conference of the prognostics and health management society.
Language(s) - English
Resource type - Journals
ISSN - 2325-016X
DOI - 10.36001/phme.2022.v7i1.3338
Subject(s) - prognostics , fuzzy logic , reliability engineering , insulated gate bipolar transistor , degradation (telecommunications) , power (physics) , computer science , reliability (semiconductor) , engineering , artificial intelligence , electronic engineering , electrical engineering , physics , quantum mechanics , voltage