z-logo
open-access-imgOpen Access
Image Feature Selection using Ant Colony Optimization
Author(s) -
Richa Sharma*,
A. Purohit
Publication year - 2019
Publication title -
international journal of innovative technology and exploring engineering
Language(s) - English
Resource type - Journals
ISSN - 2278-3075
DOI - 10.35940/ijitee.l3396.119119
Subject(s) - computer science , feature selection , artificial intelligence , ant colony optimization algorithms , pattern recognition (psychology) , feature extraction , feature (linguistics) , data mining , process (computing) , machine learning , philosophy , linguistics , operating system
With the enhancement in imaging technology, huge amount of information is being created whose classification is a challenging task among researchers. The classification performance is solely dependent on the quality of the features defining the respective images. Hence, feature extraction from images and feature selection from this huge data is required. Image Feature Selection is a vital step which can significantly affect the performance of image classification system. This paper proposes an efficient combination of image feature extraction technique and feature selection strategy using Ant Colony Optimization (ACO). ACO utilizes overall subsets performance and local feature importance to fetch problem domain finding prime solutions. For ACO based feature selection in images most of the researchers use priori information of features. However, in this work, the features are extracted separately through the detailed analytical process which carries the best suited features for different classes of images. The performance in terms of classification accuracy has been enhanced through the optimization of features in the dataset. For experimentation and evaluating the performance of proposed work, Corel and Caltech datasets are used. Satisfactory results have been obtained with the proposed approach.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here