
Leaf Disease Detection Based on Local Gabor Binary Pattern Histogram Sequence and Neural Network
Author(s) -
Nagamani HS*,
D. H.
Publication year - 2020
Publication title -
international journal of innovative technology and exploring engineering
Language(s) - English
Resource type - Journals
ISSN - 2278-3075
DOI - 10.35940/ijitee.e2864.059720
Subject(s) - histogram , local binary patterns , artificial intelligence , pattern recognition (psychology) , blight , cluster analysis , artificial neural network , computer science , image (mathematics) , biology , botany
Agriculture forms the main source of food in India, especially in the southern area. The economy of India directly depends on agriculture plants. But due to some major diseases such as blast, brown spot, and bacterial blight, there is a reduction in plant growth which greatly affects agricultural productivity. The farmers add irrelevant pesticides with their limited knowledge which will degrade the quality of the crop but also degrade the soil quality. In the proposed method Machine Vision techniques based on neural networks are used to detect plant health or diseases indicated by leaf anomaly. Image processing algorithms such as K means clustering is used to segment affected areas. From the segmented images of the plant leaf, features are extracted using Color Coherence Vector (CCV) and Local Gabor Binary Pattern Histogram Sequence (LGBPHS). The extracted features are fed as input to a backpropagation neural network to classify the unhealthy leaf.