Open AccessA Novel Method for Detecting Parametric Faults in Analog Circuits using Fuzzy Logic
Author(s) -
S. Karthi,
K. Kavitha,
J. R. Dinesh Kumar
Publication year - 2020
Publication title -
international journal of innovative technology and exploring engineering
Language(s) - English
Resource type - Journals
ISSN - 2278-3075
DOI - 10.35940/ijitee.c8883.019320
Subject(s) - testability , parametric statistics , fault detection and isolation , fault (geology) , fuzzy logic , stuck at fault , transfer function , computer science , filter (signal processing) , engineering , electronic engineering , design for testing , artificial intelligence , mathematics , reliability engineering , electrical engineering , statistics , actuator , seismology , geology
The demand for testability analysis of analog circuits has been increased in recent years. The fault detection and fault classification method is important in detecting the parametric faults of the circuit. In this paper, Simulation Before Test (SBT) is considered as a basic mechanism for detecting the parametric faults.. The circuit Under Test (CUT) used is Sallen-Key bandpass filter. Transfer function of the CUT is used for fault detection by locating the poles and Zeros of the transfer function. Fuzzy logic is used for fault classification.