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The Coefficient of Variation Chart based on Median Run Length
Author(s) -
Ming Ha Lee,
Kim Sun Yong,
XinYing Chew,
Man Fai Lau,
Patrick Then
Publication year - 2019
Publication title -
international journal of engineering and advanced technology
Language(s) - English
Resource type - Journals
ISSN - 2249-8958
DOI - 10.35940/ijeat.f1035.0986s319
Subject(s) - chart , control chart , coefficient of variation , statistics , x bar chart , ewma chart , mathematics , process (computing) , computer science , operating system
This study suggests a design of the coefficient of variation (CV) chart based on the median run length (MRL). The run length distribution of the CV chart changes from highly skewed when the process is in-control to nearly symmetric when the process is out-of-control at the larger shifts. Therefore, the MRL can be used as an appropriate performance measure to provide a meaningful information for the performance of the CV chart. The procedure for the design of the CV chart based on the MRL will be provided. An industrial example is provided to illustrate the implementation of the CV chart.

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