Open AccessSpectral, HR-XRD, Thermal and Dielectric Studies on Mixed Solvent Grown DAST Single Crystals
Author(s) -
M. Krishna Kumar
Publication year - 2019
Publication title -
international journal of engineering and advanced technology
Language(s) - English
Resource type - Journals
ISSN - 2249-8958
DOI - 10.35940/ijeat.a1178.1291s419
Subject(s) - dielectric , materials science , crystal (programming language) , single crystal , dielectric loss , solvent , character (mathematics) , thermal decomposition , kinetic energy , thermal , crystallography , analytical chemistry (journal) , optoelectronics , chemistry , organic chemistry , thermodynamics , geometry , mathematics , physics , quantum mechanics , computer science , programming language
The highly meritorious single crystal ofDAST (4-N,N-dimethylamino-4’-N’-methylstilbazolium tosylate) was grown through solution growth technique. The grown single crystals crystalline perfection analysis was made by HRXRD studies. The dielectric constant (ε), dielectric loss (ε) of DAST crystal was studied at different temperatures. The thermal decomposition stages were examined by using thermogram of DAST crystal and also it was giving best description of kinetic changes. Dielectric character was studied to the DAST crystal. The dielectric character of DAST was too analyzed.