1T semi-floating gate image sensor with enhanced quantum efficiency and high response speed
Author(s) -
Zi-Liang Tian,
Chenxi Yue,
Lin Chen,
Hao Zhu,
Qingqing Sun,
David Wei Zhang
Publication year - 2020
Publication title -
japanese journal of applied physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.487
H-Index - 129
eISSN - 1347-4065
pISSN - 0021-4922
DOI - 10.35848/1347-4065/ab6e04
Subject(s) - photodiode , sensitivity (control systems) , optoelectronics , image sensor , transistor , quantum efficiency , dark current , materials science , pixel , optics , photodetector , physics , electronic engineering , engineering , quantum mechanics , voltage
The active pixel image sensor based on a semi-floating gate transistor (SFGT-APS) has been proposed and investigated; however, the quantum efficiency (QE) and the sensitivity are too poor to meet low illumination intensity and high-speed application due to the shallow junction of photodiodes. In this work, we demonstrate a new structure, called buried photodiode semi-floating gate transistor active pixel image sensor (BSFGT-APS), which possesses enhanced QE, high sensitivity, and fast response speed. Moreover, BSFGT-APS has the same fill factor with SFGT-APS, which is 55% with a 1 μ m 2 photodiode in 0.13 μ m process. The basic device characteristics were investigated by Sentaurus TCAD simulation, including potential of photodiode, transient response, dark current, conversion gain, and full well capacity.
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