Open AccessCALCULATION OF SAFETY INDEX FOR FOREIGN ORIGIN ELECTRONIC COMPONENTS
Author(s) -
Liliia I. Suleimanova,
Frpc Jsc ‘Rpa ‘Mars’,
Tatiana I. Davydova
Publication year - 2020
Publication title -
avtomatizaciâ processov upravleniâ
Language(s) - English
Resource type - Journals
ISSN - 1991-2927
DOI - 10.35752/1991-2927-2020-4-62-33-37
Subject(s) - operability , reliability (semiconductor) , reliability engineering , computer science , mode (computer interface) , electronic component , index (typography) , engineering , mechanical engineering , thermodynamics , physics , power (physics) , world wide web , operating system
The article deals with problems arising from the use of foreign origin electronic components, being off the line in standby (storage) mode during operation with periodic monitoring of their operability, as well as with possible ways to solve these problems. It proposes the method of assessing the safety index based on determining the characteristics of foreign origin electronic components for the standby (storage) mode. The method is implemented using mathematical models with the activation energy of physical and chemical processes of electronic components degradation. The use of mathematical models to solve the problem may allow forecasting the reliability of products in the most efficient way. The authors give calculations and comparative analysis of the minimum service life (minimum shelf life) at an elevated temperature for several groups of foreign origin electronic components and for several models of external influencing factors.