Open AccessReliability and Validity of The Career EMC Scale for University Students
Author(s) -
Yuree Kim,
Ahn Doehee
Publication year - 2015
Publication title -
pyeongsaeng gyoyug.hrd yeon'gu
Language(s) - English
Resource type - Journals
ISSN - 1738-9224
DOI - 10.35637/klehrd.2015.11.2.001
Subject(s) - reliability (semiconductor) , scale (ratio) , psychology , reliability engineering , applied psychology , engineering , physics , power (physics) , quantum mechanics