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A backlighting method for accurate inspection of woven fabric density
Author(s) -
Jie Zhang,
Ruru Pan,
Weidong Gao
Publication year - 2017
Publication title -
industria textila
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.281
H-Index - 14
ISSN - 1222-5347
DOI - 10.35530/it.068.01.1321
Subject(s) - backlight , computer vision , artificial intelligence , skew , projection (relational algebra) , hough transform , yarn , woven fabric , transmission (telecommunications) , binary image , image (mathematics) , computer science , binary number , segmentation , image processing , materials science , mathematics , algorithm , liquid crystal display , composite material , telecommunications , arithmetic , operating system

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