DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE | Zendy

Konstantin Zolnikov | Zendy; I. A. Strukov | Zendy; К. Чубур | Zendy; Sergey Grechanyy | Zendy; A. Yagodkin | Zendy; Ekaterina Grosheva | Zendy

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DEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE

Author(s) -

Konstantin Zolnikov,

I. A. Strukov,

К. Чубур,

Sergey Grechanyy,

A. Yagodkin,

Ekaterina Grosheva

Publication year - 2021

Language(s) - English

Resource type - Conference proceedings

DOI - 10.34220/mamsp_253-256

Subject(s) - radiation , ionizing radiation , degradation (telecommunications) , radiation resistance , space radiation , nuclear engineering , computer science , radiation monitoring , reliability engineering , resistance (ecology) , nuclear radiation , environmental science , engineering , systems engineering , aerospace engineering , physics , irradiation , telecommunications , nuclear physics , ecology , cosmic ray , biology

This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.

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