Open AccessDEVELOPMENT OF MEANS FOR MONITORING THE PARAMETERS OF MICROCHIPS FOR ASSESSING RADIATION RESISTANCE
Author(s) -
Konstantin Zolnikov,
I. A. Strukov,
К. Чубур,
Sergey Grechanyy,
A. Yagodkin,
Ekaterina Grosheva
Publication year - 2021
Language(s) - English
Resource type - Conference proceedings
DOI - 10.34220/mamsp_253-256
Subject(s) - radiation , ionizing radiation , radiation resistance , nuclear engineering , degradation (telecommunications) , computer science , reliability engineering , radiation monitoring , environmental science , space radiation , resistance (ecology) , engineering , physics , irradiation , nuclear physics , telecommunications , ecology , cosmic ray , biology
This article discusses the technical means of monitoring the performance of a special-purpose ECB for experimental evaluation of radiation resistance, in the absence of test measuring equipment that allows you to control the areas of the most degraded degradation when exposed to ionizing radiation and heavy charged particles of outer space.