EFFECT OF SPACE SPACE FACTORS ON CMOS TECHNOLOGY CHIP | Zendy

I. Zhuravleva | Zendy

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EFFECT OF SPACE SPACE FACTORS ON CMOS TECHNOLOGY CHIP

Author(s) -

I. Zhuravleva

Publication year - 2021

Language(s) - English

Resource type - Conference proceedings

DOI - 10.34220/mamsp_209-213

Subject(s) - cmos , silicon , space radiation , chip , integrated circuit , radiation , dielectric , space (punctuation) , ionizing radiation , materials science , radiation resistance , electronic engineering , electronic circuit , optoelectronics , space technology , space environment , silicon chip , electrical engineering , computer science , engineering , optics , physics , irradiation , aerospace engineering , geophysics , nuclear physics , cosmic ray , astrophysics , operating system

The resistance of the IC to all kinds of radiation is established by various types of integrated circuits with a characteristic structure, the criteria of which are allowed to record single or multiple transformations. The article considers that a significant influence on the suitability of microcircuits in the situation of exposure to ionizing radiation is manifested not by spatial phenomena in silicon, but by surface effects related to the silicon-dielectric distribution line.

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