Open AccessEFFECT OF SPACE SPACE FACTORS ON CMOS TECHNOLOGY CHIP
Author(s) -
I. Zhuravleva
Publication year - 2021
Language(s) - English
Resource type - Conference proceedings
DOI - 10.34220/mamsp_209-213
Subject(s) - cmos , space radiation , silicon , chip , integrated circuit , space (punctuation) , radiation , dielectric , electronic engineering , radiation resistance , ionizing radiation , space technology , electronic circuit , materials science , space environment , optoelectronics , computer science , electrical engineering , engineering , physics , optics , irradiation , aerospace engineering , cosmic ray , astrophysics , nuclear physics , operating system , geophysics
The resistance of the IC to all kinds of radiation is established by various types of integrated circuits with a characteristic structure, the criteria of which are allowed to record single or multiple transformations. The article considers that a significant influence on the suitability of microcircuits in the situation of exposure to ionizing radiation is manifested not by spatial phenomena in silicon, but by surface effects related to the silicon-dielectric distribution line.