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Reliability Analysis of Systems Using Single Valued Neutrosophic Multisets
Author(s) -
Sang Yeop Cho
Publication year - 2017
Publication title -
journal of knowledge information technology and systems
Language(s) - English
Resource type - Journals
eISSN - 2734-0570
pISSN - 1975-7700
DOI - 10.34163/jkits.2017.12.2.004
Subject(s) - reliability (semiconductor) , computer science , data mining , reliability engineering , engineering , power (physics) , physics , quantum mechanics

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