Open AccessValues of Travel Time Reliability Revealed by Toll Road Uses
Author(s) -
최영은,
Sung-Soo Kim
Publication year - 2018
Publication title -
journal of transport research
Language(s) - English
Resource type - Journals
eISSN - 2713-7090
pISSN - 1738-4028
DOI - 10.34143/jtr.2018.25.2.1
Subject(s) - toll , reliability (semiconductor) , toll road , transport engineering , geography , statistics , engineering , medicine , mathematics , immunology , physics , power (physics) , quantum mechanics
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