Open AccessCharacteristics of Invalidated Patents - Econometric Analysis of Patent Invalidation Trial Data of Korea
Author(s) -
Jungyoung Lee,
Choon-Geol Moon
Publication year - 2020
Publication title -
ji'sig jae'san yeon'gu/jisik jaesan yeongu
Language(s) - English
Resource type - Journals
eISSN - 2733-8487
pISSN - 1975-5945
DOI - 10.34122/jip.2020.15.4.263
Subject(s) - econometrics , economics