Open AccessRegressive model approach to the generation of test trajectories
Author(s) -
Brian James Taylor
Publication year - 1999
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.33915/etd.996
Subject(s) - trajectory , reliability (semiconductor) , process (computing) , test data , computer science , data point , identification (biology) , data mining , algorithm , reliability engineering , engineering , power (physics) , physics , botany , quantum mechanics , astronomy , biology , programming language , operating system
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