Open AccessErbium alloyed AlN thin films: Structural, piezoelectric and magnetic properties
Author(s) -
V. Narang
Publication year - 2019
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.33915/etd.6293
Subject(s) - materials science , x ray photoelectron spectroscopy , thin film , erbium , analytical chemistry (journal) , lattice constant , sputter deposition , crystallite , sputtering , doping , diffraction , metallurgy , nuclear magnetic resonance , optoelectronics , nanotechnology , optics , chemistry , physics , chromatography