Open AccessSoftware quality and reliability prediction using Dempster -Shafer theory
Author(s) -
Lan Guo
Publication year - 2004
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.33915/etd.2112
Subject(s) - dempster–shafer theory , software quality , reliability (semiconductor) , computer science , software , data mining , artificial intelligence , reliability engineering , machine learning , quality (philosophy) , software development , engineering , power (physics) , philosophy , physics , epistemology , quantum mechanics , programming language
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