Open AccessEstimating reliability impact of biometric devices in large scale applications
Author(s) -
Karthikeyan Mahadevan
Publication year - 2003
Language(s) - English
Resource type - Dissertations/theses
DOI - 10.33915/etd.1352
Subject(s) - biometrics , reliability (semiconductor) , computer science , component (thermodynamics) , reliability engineering , scale (ratio) , authentication (law) , data mining , artificial intelligence , engineering , computer security , power (physics) , physics , quantum mechanics , thermodynamics
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