Open AccessBayesian Estimation of Stress Strength Reliability using Upper Record Values from Generalised Inverted Exponential Distribution
Author(s) -
Ritu Kumari,
Kalpana K. Mahajan,
Sangeeta Arora
Publication year - 2019
Publication title -
international journal of mathematical, engineering and management sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.228
H-Index - 10
ISSN - 2455-7749
DOI - 10.33889/ijmems.2019.4.4-070
Subject(s) - exponential distribution , bayes' theorem , estimator , mathematics , reliability (semiconductor) , statistics , bayes estimator , bayesian probability , exponential function , prior probability , stress (linguistics) , mathematical analysis , physics , power (physics) , linguistics , philosophy , quantum mechanics
The paper develops Bayesian estimators and HPD intervals for the stress strength reliability of generalised inverted exponential distribution using upper record values. For prior distribution, informative prior as well as non-informative prior both are considered. The Bayes estimators are obtained under both symmetric and asymmetric loss functions. A simulation study is conducted to obtain the Bayes estimates of stress strength reliability. Simulated data sets are also considered here for illustration purpose.