Open AccessPatent Quality: Towards a Systematic Framework for Analysis and Measurement
Author(s) -
Kyle Higham,
Gaétan de Rassenfosse,
Adam B. Jaffe
Publication year - 2020
Language(s) - English
Resource type - Reports
DOI - 10.3386/w27598
Subject(s) - quality (philosophy) , consistency (knowledge bases) , measure (data warehouse) , stakeholder , work (physics) , distribution (mathematics) , relation (database) , test (biology) , business , patent visualisation , computer science , data science , data mining , engineering , public relations , political science , mathematics , mechanical engineering , mathematical analysis , paleontology , philosophy , epistemology , artificial intelligence , biology