Open AccessThe Reliability of Subjective Well-Being Measures
Author(s) -
Alan B. Krueger,
David Schkade
Publication year - 2007
Language(s) - English
Resource type - Reports
DOI - 10.3386/w13027
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , psychology , statistics , mathematics , engineering , physics , power (physics) , quantum mechanics
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