Open AccessMethod of time distribution for repair of radio electronic means with multiple defects
Author(s) -
Lev Sakovych,
Yevhen Ryzhov,
Artem Soboliev
Publication year - 2019
Publication title -
vìjsʹkovo-tehnìčnij zbìrnik
Language(s) - English
Resource type - Journals
eISSN - 2708-5228
pISSN - 2312-4458
DOI - 10.33577/2312-4458.21.2019.72-77
Subject(s) - reliability engineering , computer science , reliability (semiconductor) , modular design , process (computing) , engineering , power (physics) , physics , quantum mechanics , operating system