Open AccessAnalysis of the application of the method of forecasting the reliability of radioelectronic means at the test noise level
Author(s) -
Liudmyla Korotchenko,
G. D. Radzivilov,
Volodymyr Hulii,
S. M. Yakovenko
Publication year - 2019
Publication title -
vìjsʹkovo-tehnìčnij zbìrnik
Language(s) - English
Resource type - Journals
eISSN - 2708-5228
pISSN - 2312-4458
DOI - 10.33577/2312-4458.21.2019.67-71
Subject(s) - reliability (semiconductor) , noise (video) , reliability engineering , channel (broadcasting) , interference (communication) , computer science , limit (mathematics) , electronic equipment , component (thermodynamics) , engineering , telecommunications , mathematics , artificial intelligence , power (physics) , mathematical analysis , physics , quantum mechanics , computer hardware , image (mathematics) , thermodynamics