Open AccessPengujian Sistem Monitoring Listrik Berbasis NodeMCU Menggunakan Blackbox Testing
Author(s) -
Muhammad Fatih Yordani,
Aris Sudaryanto
Publication year - 2021
Publication title -
informatics, electrical and electronics engineering
Language(s) - Uncategorized
Resource type - Journals
ISSN - 2798-0197
DOI - 10.33474/infotron.v1i2.11331
Subject(s) - operating system , computer science