Open AccessReliability and Fault Analysis of a Stochastic Model of a Standby System with Cost Depended Repair/Replacement of Substandard Unit and Correlated Life Time
Author(s) -
Sarita Sarita,
Pavansh Bhatia,
S. Kumar,
Harish Kumar Dhingra
Publication year - 2022
Publication title -
journal of scientific research
Language(s) - English
Resource type - Journals
eISSN - 2070-0245
pISSN - 2070-0237
DOI - 10.3329/jsr.v14i2.57494
Subject(s) - reliability engineering , bivariate analysis , reliability (semiconductor) , unit (ring theory) , computer science , exponential distribution , exponential function , point (geometry) , statistics , mathematics , engineering , mathematical analysis , power (physics) , physics , mathematics education , geometry , quantum mechanics
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