Open AccessReduction of Random Dopant Fluctuation-induced Variation in Junctionless FinFETs via Negative Capacitance Effect
Author(s) -
Bo Liu,
Xianlong Chen,
Ziqiang Xie,
Mengxue Guo,
Mengjie Zhao,
Weifeng Lyu
Publication year - 2021
Publication title -
informacije midem - journal of microelectronics electronic components and materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.122
H-Index - 18
eISSN - 1855-4709
pISSN - 0352-9045
DOI - 10.33180/infmidem2021.405
Subject(s) - threshold voltage , dopant , materials science , capacitance , subthreshold swing , condensed matter physics , standard deviation , optoelectronics , negative impedance converter , monte carlo method , transistor , doping , voltage , physics , mathematics , statistics , quantum mechanics , electrode , voltage source
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