Open AccessFPGA Based Characterization of Thin Film For Guided Mode Resonance Devices Utilizing Layer-By-Layer Deposition of Nano-Particles
Author(s) -
Shekhar Suman Borah
Publication year - 2021
Publication title -
asian journal of convergence in technology
Language(s) - English
Resource type - Journals
ISSN - 2350-1146
DOI - 10.33130/ajct.2020v07i01.021
Subject(s) - materials science , layer (electronics) , thin film , deposition (geology) , layer by layer , field programmable gate array , optoelectronics , characterization (materials science) , nanometre , nanotechnology , verilog , nano , computer science , computer hardware , composite material , paleontology , sediment , biology
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom