Open AccessTesting accelerated life data of micro switches
Author(s) -
Vivien Sipkás,
Gabriella Bognár
Publication year - 2019
Publication title -
design of machines and structures
Language(s) - English
Resource type - Journals
eISSN - 2064-7522
pISSN - 1785-6892
DOI - 10.32972/dms.2019.014
Subject(s) - workbench , accelerated life testing , reliability engineering , computer science , taguchi methods , reliability (semiconductor) , embedded system , engineering , artificial intelligence , psychology , developmental psychology , maturity (psychological) , power (physics) , physics , quantum mechanics , machine learning , visualization
The aim of this paper is to introduce a testing method for accelerated lifetime testing applicable for micro switches. To predict the lifetime the operating environment in the test device is designed to accelerate the switches’ failure. The design of experiments is prepared with using the Taguchi method for different productions of micro switches applying different switching speed and different humidity values in the workbench.