Open AccessAPPLICATION OF ELECTRONIC HARDNESS MEASURING INSTRUMENTS TO IMPROVE QUALITY AND RELIABILITY WHEN PRODUCING SPECIAL EQUIPMENT
Author(s) -
O.V. Alkhovyk
Publication year - 2021
Publication title -
včenì zapiski tavrìjsʹkogo nacìonalʹnogo unìversitetu ìmenì v. ì. vernadsʹkogo. serìâ tehnìčnì nauki
Language(s) - English
Resource type - Journals
eISSN - 2663-595X
pISSN - 2663-5941
DOI - 10.32838/2663-5941/2021.2-2/01
Subject(s) - reliability (semiconductor) , reliability engineering , quality (philosophy) , computer science , engineering , physics , power (physics) , quantum mechanics